Proceedings of the IEEE 1987 Custom Integrated Circuits Conference
... Digital Bipolar) Process Technology (3) NFT (Native Fault Testing) Refer to Honeywella#39;s Bipolar Design Manual for more infc are separate designs. ... PERFORMANCE-PROORAMMABIE MACROCELLS The individual gate arrays would not be a true family unless they were ... Feature, HM3S00 HM3500M HE8000 HM10000 HVM10000 HE12000 Equivalent Gates 3, 500 3, 500 8, 000 10, 000 10, 000anbsp;...
| Title | : | Proceedings of the IEEE 1987 Custom Integrated Circuits Conference |
| Author | : | IEEE Electron Devices Society, Institute of Electrical and Electronics Engineers. Rochester Section, IEEE Solid-State Circuits Council |
| Publisher | : | - 1987 |
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