Nondestructive Residual Strain Measurement Using High Energy X-ray Diffraction

Nondestructive Residual Strain Measurement Using High Energy X-ray Diffraction

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A nondestructive high energy (60 keV) x-ray diffraction method to measure the internal strain depth-profile in materials was developed using a standard 320 kV p laboratory x-ray source. Traditional x-ray strain measurements are limited to few microns of depth due to the limited penetration of Cu Kalpha and Mo K alpha radiation if a synchrotron or neutron source is not used. The high energy used allows for greater penetration without a synchrotron or neutron facility. Results for aluminum with penetration depths of 1000 mu m and for titanium with penetration depths of 300 mum are demonstrated. The spatial resolution of this depth-profile is 50 mu m to 125mum depending on the collimation and attenuation of the sample. Sensitivity to a lattice parameter change of 0.001A is demonstrated. An energy dispersive HPGe detector is used to perform fixed-angle diffraction measurements. The strain depth-profile measurement is performed by observing the change in the position of the diffraction peaks in the energy dispersive spectrum. A simulation program of the diffraction system for modeling and validating the experimental setup is developed. A new technique to measure the strain using the natural width of the tungsten K alpha1 line and the diffraction peak normalized intensity is presented. The results of the energy dispersive technique and the tungsten K alpha1 line width technique are compared to the results obtained using high energy XRD theta-2theta scans technique. Finally we present a preliminary study of the thermal relaxation of residual stress.IsMCAOpen) { CONNECTIONaˆ’agt;Open ( ) ; //open MCA if not opened } arrayalt;intagt;aquot; MCAData; MCAData = s af e _c as t 192. String E† Motor4PLIMLVL ; //Motor 4 positive limit leve l ( see 6K manual ) String E† Motor5PLIMLVL; //Motor 5 positive limitanbsp;...

Title:Nondestructive Residual Strain Measurement Using High Energy X-ray Diffraction
Author: Mohammad Yousef Al-Shorman
Publisher:ProQuest - 2008

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